About this scholarly article

2005 IEEE Workshop on Microelectronics and Electron Devices, 2005. WMED '05. - Atomic-scale electrical characterization of carbon nanotubes on silicon surfaces with the UHV-STM by Albrecht, P.M.; Lyding, J.W. is a scholarly article available to read on EtoBox.

Author

Albrecht, P.M.; Lyding, J.W.

Publisher

IEEE

Published

2005

Language

EN