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About this Engineering article
Observation of near interface oxide traps in single crystalline Nd[sub 2]O[sub 3] on Si(111) by quasistatic C-V method by Sun, Qing-Qing; Laha, Apurba; Ding, Shi-Jin; Zhang, David Wei; Osten, H. Jörg; Fissel, A is a Engineering article available to read on EtoBox.
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- Author
- Sun, Qing-Qing; Laha, Apurba; Ding, Shi-Jin; Zhang, David Wei; Osten, H. Jörg; Fissel, A
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Physical Sciences)