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About this scholarly article
2010 IEEE International Ultrasonics Symposium - Modeling and measuring the effects of mutual impedance on multi-cell CMUT configurations by Park, K. K.; Kupnik, M.; Lee, H. J.; Khuri-Yakub, B. T.; Wygant, I. O. is a scholarly article available to read on EtoBox.
- Author
- Park, K. K.; Kupnik, M.; Lee, H. J.; Khuri-Yakub, B. T.; Wygant, I. O.
- Publisher
- IEEE
- Published
- 2010
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