About this scholarly article

2019 Electron Devices Technology and Manufacturing Conference (EDTM) - Semi-classical modeling of nanoscale nMOSFETs with III-V channel by Palestri, Pierpaolo; Caruso, Enrico; Badami, Oves; Driussi, Francesco; Esseni, David; Selmi, Luca is a scholarly article available to read on EtoBox.

Author

Palestri, Pierpaolo; Caruso, Enrico; Badami, Oves; Driussi, Francesco; Esseni, David; Selmi, Luca

Publisher

IEEE

Published

2019