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What is SIMS Depth Profiling Analysis of Electrical Arc Residues in Fire Investigation about?

The study employs Secondary Ion Mass Spectrometry (SIMS) to analyze electrical arc residues from fire incidents, distinguishing between primary and secondary arc beads. Results show that primary arc beads have a thin surface layer enriched with carbon, chlorine, and oxygen, while secondary arc beads exhibit a thicker chlorine layer, aiding in identifying the fire

Author

leo

Language

EN