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About this Computer Science article
Image Denoising Based on Nonlocal Bayesian Singular Value Thresholding and Stein’s Unbiased Risk Estimator by Yan, Ning; Liu, Dong; Li, Houqiang; Li, Bin; Li, Li; Wu, Feng is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Yan, Ning; Liu, Dong; Li, Houqiang; Li, Bin; Li, Li; Wu, Feng
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1057-7149)
- Published
- 2019
- Field
- Computer Science (Physical Sciences)
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