About this scholarly article

SPIE Proceedings [SPIE 1988 Intl Congress on Optical Science and Engineering - Hamburg, Germany (Monday 19 September 1988)] In-Process Optical Measurements - Miniature Light Scattering Systems For On-Line Process Particle Size And Velocity Measurement by Brown, R. G. W.; Burnett, J. G.; Chow, K.; Rarity, J. G.; Spring, Kenneth H. is a scholarly article available to read on EtoBox.

Author

Brown, R. G. W.; Burnett, J. G.; Chow, K.; Rarity, J. G.; Spring, Kenneth H.

Publisher

SPIE

Published

1989