About this scholarly article

2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - Oxide-trap based on charge pumping (OTCP) extraction method for irradiated MOSFET Devices: Part II (Low frequencies) by Djezzar, B.; Smatti, A.; Oussalah, S. is a scholarly article available to read on EtoBox.

Author

Djezzar, B.; Smatti, A.; Oussalah, S.

Publisher

IEEE

Published

2003

Language

EN