About this scholarly article

SPIE Proceedings [SPIE SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring - San Diego, California, United States (Sunday 8 March 2015)] Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2015 - Structural damage identification using piezoelectric impedance and Bayesian inference by Lynch, Jerome P.; Shuai, Q.; Zhou, K.; Tang, J. is a scholarly article available to read on EtoBox.

Author

Lynch, Jerome P.; Shuai, Q.; Zhou, K.; Tang, J.

Publisher

SPIE

Published

2015

Language

EN