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About this Engineering article
Effect of Cu Impurities on in IrMnCu/CoFe Exchange Bias System by Aley, N.P.; Bonet, C.; Lafferty, B.; O'Grady, K. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Aley, N.P.; Bonet, C.; Lafferty, B.; O'Grady, K.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9464)
- Published
- 2009
- Language
- EN
- Field
- Engineering (Physical Sciences)
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