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Single-Event Transient Characterization of a Radiation-Tolerant Charge-Pump Phase-Locked Loop Fabricated in 130 nm PD-SOI Technology by Chen, Zhuojun (author);Lin, Min (author);Zheng, Yunlong (author);Wei, Zuodong (author);Huang, Shuigen (author);Zou, Shichang (author) is a Engineering article available to read on EtoBox.
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- Author
- Chen, Zhuojun (author);Lin, Min (author);Zheng, Yunlong (author);Wei, Zuodong (author);Huang, Shuigen (author);Zou, Shichang (author)
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Published
- 2016
- Field
- Engineering (Physical Sciences)