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About this Engineering article
"An investigation of the silicon—Sapphire interface using the MIS capacitance method" by Goodman, A.M. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Goodman, A.M.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 1975
- Field
- Engineering (Physical Sciences)