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About this Engineering article
Reliable identification of the complex or superlattice nature of intrinsic and extrinsic stacking faults in the L12 phase by high-resolution imaging by N. Karpstein; M. Lenz; A. Bezold; M. Wu; S. Neumeier; E. Spiecker is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- N. Karpstein; M. Lenz; A. Bezold; M. Wu; S. Neumeier; E. Spiecker
- Publisher
- Elsevier BV
- Published
- 2023
- Field
- Engineering (Physical Sciences)
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