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About this Engineering article
An observation of charge trapping phenomena in GaN/AlGaN/Gd[sub 2]O[sub 3]/Ni–Au structure by L. B. Chang; A. Das; R. M. Lin; S. Maikap; M. J. Jeng; S. T. Chou is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- L. B. Chang; A. Das; R. M. Lin; S. Maikap; M. J. Jeng; S. T. Chou
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2011
- Language
- EN
- Field
- Engineering (Physical Sciences)
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