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About this Engineering article
Quantitative Structural Analysis of Binary Nanocrystal Superlattices by Electron Tomography by Friedrich, Heiner; Gommes, Cedric J.; Overgaag, Karin; Meeldijk, Johannes D.; Evers, Wiel H.; Nijs, Bart de; Boneschanscher, Mark P.; de Jongh, Petra E.; Verkleij, Arie J.; de Jong, Krijn P.; van Blaaderen, Alfons; Vanmaekelbergh, Daniel is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Friedrich, Heiner; Gommes, Cedric J.; Overgaag, Karin; Meeldijk, Johannes D.; Evers, Wiel H.; Nijs, Bart de; Boneschanscher, Mark P.; de Jongh, Petra E.; Verkleij, Arie J.; de Jong, Krijn P.; van Blaaderen, Alfons; Vanmaekelbergh, Daniel
- Publisher
- American Chemical Society; American Chemical Society (ACS) (ISSN 1530-6984)
- Published
- 2009
- Language
- EN
- Field
- Engineering (Physical Sciences)