About this scholarly article

SPIE Proceedings [SPIE 33rd Annual Techincal Symposium - San Diego (Monday 7 August 1989)] Surface Characterization and Testing II - Irradiance Moments Computed From Hartley Transform For Rough Surface Classification by Gorecki, Christophe; Arpin, Michel; Greivenkamp, John E.; Young, Matthew is a scholarly article available to read on EtoBox.

Author

Gorecki, Christophe; Arpin, Michel; Greivenkamp, John E.; Young, Matthew

Publisher

SPIE

Published

1989