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About this Engineering article
Electrical and thermal stability of AuGeNi OHMIC contacts to GaAs fabricated with in situ RF sputter cleaning : A. Callegari, D. Lacey and E. T.-S. Pan. Solid-St. Electron.29(5), 523 (1986) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1987
- Field
- Engineering (Physical Sciences)