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About this Engineering article
Atomic-resolution analysis of degradation phenomena in SOFCS: A case study of SO2 poisoning in LSM cathodes by Daio, Takeshi; Mitra, Pratoy; Lyth, Stephen M.; Sasaki, Kazunari is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Daio, Takeshi; Mitra, Pratoy; Lyth, Stephen M.; Sasaki, Kazunari
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0360-3199)
- Published
- 2016
- Field
- Engineering (Physical Sciences)