About this scholarly article

2016 17th International Symposium on Quality Electronic Design (ISQED) - 5nm: Has the time for a device change come? by Raghavan, P.; Bardon, M. Garcia; Debacker, P.; Schuddinck, P.; Jang, D.; Baert, R.; Verkest, D.; Thean, A. V-Y is a scholarly article available to read on EtoBox.

Author

Raghavan, P.; Bardon, M. Garcia; Debacker, P.; Schuddinck, P.; Jang, D.; Baert, R.; Verkest, D.; Thean, A. V-Y

Publisher

IEEE

Published

2016

Language

EN