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Gate energy efficiency and negative capacitance in ferroelectric 2D/2D TFET from cryogenic to high temperatures by Kamaei, Sadegh (author);Saeidi, Ali (author);Gastaldi, Carlotta (author);Rosca, Teodor (author);Capua, Luca (author);Cavalieri, Matteo (author);Ionescu, Adrian M. (author) is a Materials Science article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Materials Science.

Author
Kamaei, Sadegh (author);Saeidi, Ali (author);Gastaldi, Carlotta (author);Rosca, Teodor (author);Capua, Luca (author);Cavalieri, Matteo (author);Ionescu, Adrian M. (author)
Publisher
Springer Science and Business Media LLC
Published
2021
Field
Materials Science (Physical Sciences)

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