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About this Engineering article
ESD sensitivity of GMR heads: effect of pulse length and number of events by Guarisco, D.; Li, M.L. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Guarisco, D.; Li, M.L.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9464)
- Published
- 2001
- Field
- Engineering (Physical Sciences)