About this Materials Science article
Comparative Study of Depth and Lateral Distributions of Electron Excitation Between Scanning Ion and Scanning Electron Microscopes by Ohya, K. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Ohya, K.
- Publisher
- Oxford University Press; Oxford University Press (OUP) (ISSN 0022-0744)
- Published
- 2003
- Language
- EN
- Field
- Materials Science (Physical Sciences)