About this scholarly article

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California (Sunday 1 August 2010)] Developments in X-Ray Tomography VII - Recent developments in x-ray Talbot interferometry at ESRF-ID19 by Weitkamp, Timm; Zanette, Irene; David, Christian; Baruchel, José; Bech, Martin; Bernard, Pascal; Deyhle, Hans; Donath, Tilman; Kenntner, Johannes; Lang, Sabrina; Mohr, Jürgen; Müller, Bert; Pfeiffer, Franz; Reznikova, Elena; Rutishauser, Simon; Schulz, Georg; Tapfer, Arne; Valade, Jean-Paul; Stock, Stuart R. is a scholarly article available to read on EtoBox.

Author

Weitkamp, Timm; Zanette, Irene; David, Christian; Baruchel, José; Bech, Martin; Bernard, Pascal; Deyhle, Hans; Donath, Tilman; Kenntner, Johannes; Lang, Sabrina; Mohr, Jürgen; Müller, Bert; Pfeiffer, Franz; Reznikova, Elena; Rutishauser, Simon; Schulz, Georg; Tapfer, Arne; Valade, Jean-Paul; Stock, Stuart R.

Publisher

SPIE

Published

2010

Language

EN