About this scholarly article

SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications - Triangular linetype wavelength calibration process for micro-spectrometers with multichannel detectors by Wang, Yuzhao; Ye, Shenghua; Zhang, Guangjun; Zhang, Yinchao; Wu, Yan; Ni, Jun; Chen, Siying; Qiu, Zongjia; Ni, Guoqiang is a scholarly article available to read on EtoBox.

Author

Wang, Yuzhao; Ye, Shenghua; Zhang, Guangjun; Zhang, Yinchao; Wu, Yan; Ni, Jun; Chen, Siying; Qiu, Zongjia; Ni, Guoqiang

Publisher

SPIE

Published

2008

Language

EN