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NXP USA Passivation Damage Report by Standin. OchireJ is a document available to read on EtoBox.

A lot of pMLF MH 7B 048 from NXP USA was found to have passivation damage during a second optical inspection, affecting approximately 55 units. The issue was identified by a team and containment actions have been implemented, including holding the lot for customer notification. Further analysis revealed that the root cause is related to wafer inherent issues, and recommendations include performing 100% inspections to prevent recurrence.

Author

Standin. OchireJ

Language

EN