About this scholarly article

SPIE Proceedings [SPIE SPIE Commercial + Scientific Sensing and Imaging - Baltimore, Maryland, United States (Sunday 17 April 2016)] Dimensional Optical Metrology and Inspection for Practical Applications V - SLM-based tomography of phase objects using single-shot transport of intensity technique by Harding, Kevin G.; Zhang, Song; Nehmetallah, George; Nguyen, Thanh C.; Tran, Dat; Darudi, Ahmad; Soltani, Peyman is a scholarly article available to read on EtoBox.

Author

Harding, Kevin G.; Zhang, Song; Nehmetallah, George; Nguyen, Thanh C.; Tran, Dat; Darudi, Ahmad; Soltani, Peyman

Publisher

SPIE

Published

2016