Can I read iJTAG IEEE1687: Enhancing Test Access on EtoBox?

iJTAG IEEE1687: Enhancing Test Access by hienha0189 is a document available to read on EtoBox.

What is iJTAG IEEE1687: Enhancing Test Access about?

The document discusses using test access standards across the product lifecycle. It provides background on previous work using boundary scan and extending it to iJTAG. The document outlines how test access standards can enable hardware monitoring and simple integration of self-test structures to detect evolving faults through the device lifecycle.

Author

hienha0189

Language

EN