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About this Materials Science article
Passive Voltage Contrast Applications with Helium Ion Microscopy Imaging by Xia, Deying; McVey, Shawn; Huynh, Chuong; Kuehn, Wilhelm; Runt, Doug is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Xia, Deying; McVey, Shawn; Huynh, Chuong; Kuehn, Wilhelm; Runt, Doug
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2019
- Language
- EN
- ISBN
- 9781431927616
- Field
- Materials Science (Physical Sciences)