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About this Engineering article
High-resolution Line-scanning Optical Coherence Microscopy by Chen, Yu; Huang, Shu-Wei; Aguirre, Aaron D.; Fujimoto, James G. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chen, Yu; Huang, Shu-Wei; Aguirre, Aaron D.; Fujimoto, James G.
- Publisher
- Optical Society of America; The Optical Society (ISSN 0146-9592)
- Published
- 2007
- Language
- EN
- Field
- Engineering (Physical Sciences)
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