Skip to content

Opening book details…

About this scholarly article

Proceedings of 2011 International Conference on Electronics and Optoelectronics - Software reliability based on equipment test and evaluation by Zhang Kejun, ; Xu Wu, is a scholarly article available to read on EtoBox.

Author
Zhang Kejun, ; Xu Wu,
Publisher
IEEE
Published
2011
Language
EN

More by Zhang Kejun, ; Xu Wu,

Browse all works by Zhang Kejun, ; Xu Wu,