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Validation of Thermal Resistance Extracted From Measurements on Stripe Geometry SiGe HBTs by Balanethiram, Suresh; D'Esposito, Rosario; Fregonese, Sebastien; Chakravorty, Anjan; Zimmer, Thomas is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Balanethiram, Suresh; D'Esposito, Rosario; Fregonese, Sebastien; Chakravorty, Anjan; Zimmer, Thomas
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
Published
2019
Language
EN
Field
Engineering (Physical Sciences)

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