About this scholarly article

Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Beam diagnostic system for high intensity proton Linac at Kaeri by Park, S.J.; Park, J.H.; Bae, Y.S.; Hwang, W.H.; Huang, J.Y.; Nam, S.H.; Cho, Y.S.; Han, J.M.; Han, S.H.; Choi, B.H. is a scholarly article available to read on EtoBox.

Author

Park, S.J.; Park, J.H.; Bae, Y.S.; Hwang, W.H.; Huang, J.Y.; Nam, S.H.; Cho, Y.S.; Han, J.M.; Han, S.H.; Choi, B.H.

Publisher

IEEE

Published

2003

Language

EN