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About this Engineering article
Reliability Evaluation and Weak Component Identification of ±500kV HVDC Transmission Systems with Double-Circuit Lines on the Same Tower by Hu, Bo; Xie, Kaigui; Tai, Heng-Ming is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Hu, Bo; Xie, Kaigui; Tai, Heng-Ming
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; ScienceOpen; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0885-8977)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)