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About this scholarly article
63rd Device Research Conference Digest, 2005. DRC '05. - Tunnel oxide thickness dependence of activation energy for SiGe quantum dot flash memory by Yueran Liu, ; Shan Tang, ; Decai Yu, ; Gyeong Hwang, ; Banerjee, S. is a scholarly article available to read on EtoBox.
- Author
- Yueran Liu, ; Shan Tang, ; Decai Yu, ; Gyeong Hwang, ; Banerjee, S.
- Publisher
- IEEE
- Published
- 2005
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