Skip to content

Opening book details…

About this Engineering article

Using a new VSI EWMA average loss control chart to monitor changes in the difference between the process mean and target and/or the process variability by Yang, Su-Fen is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Yang, Su-Fen
Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 0307-904X)
Published
2013
Field
Engineering (Physical Sciences)