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2006 International Electron Devices Meeting - Prediction and Control of NBTI -- Induced SRAM Vccmin Drift by Lin, J.C.; Oates, A.S.; Tseng, H.C.; Liao, Y.P.; Chung, T.H.; Huang, K.C.; Tong, P. Y.; Yau, S.H.; Wang, Y.F. is a scholarly article available to read on EtoBox.

Author
Lin, J.C.; Oates, A.S.; Tseng, H.C.; Liao, Y.P.; Chung, T.H.; Huang, K.C.; Tong, P. Y.; Yau, S.H.; Wang, Y.F.
Publisher
IEEE
Published
2006
Language
EN

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