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About this Engineering article
Impact of Proton Irradiation on the RF Performance of 65 nm SOI CMOS Technology by Madan, Anuj; Phillips, Stanley D.; Cressler, John D.; Marshall, Paul W.; Liang, Qingqing; Freeman, Greg is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Madan, Anuj; Phillips, Stanley D.; Cressler, John D.; Marshall, Paul W.; Liang, Qingqing; Freeman, Greg
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 2009
- Field
- Engineering (Physical Sciences)