About this scholarly article

International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Band diagram and carrier conduction mechanism in ZrO/sub 2//Zr-silicate/Si MIS structure fabricated by pulsed-laser-ablation deposition by Yamaguchi, T.; Satake, H.; Fukushima, N.; Toriumi, A. is a scholarly article available to read on EtoBox.

Author

Yamaguchi, T.; Satake, H.; Fukushima, N.; Toriumi, A.

Publisher

IEEE

Published

2000

Language

EN