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About this Chemistry article
ChemInform Abstract: Evidence Provided by SIMS and EXAFS, of Ge Microclusters in GaAs Epitaxial Layers Obtained on Ge by CSVT. by DODELET, J. P. ;TOURILLON, G. ;DE PUYDT, Y. ;COSSEMENT, D. ;GUAY, D. ;BERTRAND, P. is a Chemistry article available to read on EtoBox.
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- Author
- DODELET, J. P. ;TOURILLON, G. ;DE PUYDT, Y. ;COSSEMENT, D. ;GUAY, D. ;BERTRAND, P.
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); Wiley (ISSN 0931-7597)
- Published
- 2010
- Field
- Chemistry (Physical Sciences)