About this scholarly article

2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Self-heating and reliability issues in FinFET and 3D ICs by Khan, Muhammad Imran; Buzdar, Abdul Rehman; Lin, Fujiang is a scholarly article available to read on EtoBox.

Author

Khan, Muhammad Imran; Buzdar, Abdul Rehman; Lin, Fujiang

Publisher

IEEE

Published

2014