About this scholarly article

2009 IEEE International Integrated Reliability Workshop Final Report - Simulation of statistical aspects of reliability in nano CMOS transistors by Bukhori, Muhammad Faiz; Brown, Andrew R.; Roy, Scott; Asenov, Asen is a scholarly article available to read on EtoBox.

Author

Bukhori, Muhammad Faiz; Brown, Andrew R.; Roy, Scott; Asenov, Asen

Publisher

IEEE

Published

2009

Language

EN