About this scholarly article

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Advanced 2D/3D ESD device simulation-a powerful tool already used in a pre-Si phase by Esmark, K.; Stadler, W.; Wendel, M.; Gossner, H.; Guggenmos, X.; Fichtner, W. is a scholarly article available to read on EtoBox.

Author

Esmark, K.; Stadler, W.; Wendel, M.; Gossner, H.; Guggenmos, X.; Fichtner, W.

Publisher

ESD Assoc

Published

2000

Language

EN