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About this Physics and Astronomy article
Thickness dependence mechanisms of the critical current density in high-Tccuprate superconductor films by Cherpak, Yu V; Moskaliuk, V O; Semenov, A V; Svetchnikov, V L; Tretiatchenko, C G; Pan, V M is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Cherpak, Yu V; Moskaliuk, V O; Semenov, A V; Svetchnikov, V L; Tretiatchenko, C G; Pan, V M
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0953-2048)
- Published
- 2007
- Field
- Physics and Astronomy (Physical Sciences)