About this scholarly article

2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks – Supplemental Volume (DSN-S) - Towards a Bayesian Approach for Assessing Fault Tolerance of Deep Neural Networks by Banerjee, Subho S.; Cyriac, James; Jha, Saurabh; Kalbarczyk, Zbigniew T.; Iyer, Ravishankar K. is a scholarly article available to read on EtoBox.

Author

Banerjee, Subho S.; Cyriac, James; Jha, Saurabh; Kalbarczyk, Zbigniew T.; Iyer, Ravishankar K.

Publisher

IEEE

Published

2019

Language

EN