About this scholarly article

2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Sub-pixel vision-based inspection and control of a flexure micropositioner by He, Sifeng; Tang, Hui; Zhang, Kaifu; Zhang, Bingwei; Chen, Chuangbin; Wu, Zelong; Xiang, Xiaobin; Wang, Jiang Lin; Che, Junjie; Chen, Xun; Gao, Jian is a scholarly article available to read on EtoBox.

Author

He, Sifeng; Tang, Hui; Zhang, Kaifu; Zhang, Bingwei; Chen, Chuangbin; Wu, Zelong; Xiang, Xiaobin; Wang, Jiang Lin; Che, Junjie; Chen, Xun; Gao, Jian

Publisher

IEEE

Published

2017