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About this Engineering article
Fast Blind Reconstruction with Wavelet Transforms Regularization and Total Variation Minimization for FTIR Imaging Spectrometer by Liu, Tingting; Liu, Hai; Li, Youfu; Zhang, Zhaoli; Liu, Sannyuya is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Liu, Tingting; Liu, Hai; Li, Youfu; Zhang, Zhaoli; Liu, Sannyuya
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1083-4435)
- Published
- 2018
- Language
- EN
- Field
- Engineering (Physical Sciences)
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