About this scholarly article

2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Heavy-ion-induced permanent damage in ultra-deep submicron fully depleted SOI devices by Tan, Fei; An, Xia; Huang, Liangxi; Zhang, Xing; Huang, Ru is a scholarly article available to read on EtoBox.

Author

Tan, Fei; An, Xia; Huang, Liangxi; Zhang, Xing; Huang, Ru

Publisher

IEEE

Published

2012

Language

EN