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About this Physics and Astronomy article

Chemical effect of Si + ions on the implantation-induced defects in ZnO studied by a slow positron beam by Jiang, M.; Wang, D. D.; Chen, Z. Q.; Kimura, S.; Yamashita, Y.; Mori, A.; Uedono, A. is a Physics and Astronomy article available to read on EtoBox.

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Author
Jiang, M.; Wang, D. D.; Chen, Z. Q.; Kimura, S.; Yamashita, Y.; Mori, A.; Uedono, A.
Publisher
American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
Published
2013
Language
EN
Field
Physics and Astronomy (Physical Sciences)

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