About this scholarly article

2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Developing aged SPICE model for hot carrier reliability simulation by Qiuyi Ye, ; Terletzki, H.; Tonti, W. is a scholarly article available to read on EtoBox.

Author

Qiuyi Ye, ; Terletzki, H.; Tonti, W.

Publisher

IEEE

Published

2000