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About this Engineering article
Evaluating Probes for “Electrical” Atomic Force Microscopy by T. Trenkler; T. Hantschel; R. Stephenson; P. De Wolf; W. Vandervorst; L. Hellemans; A. Malavé; D. Büchel; E. Oesterschulze; W. Kulisch; P. Niedermann; T. Sulzbach; O. Ohlsson is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- T. Trenkler; T. Hantschel; R. Stephenson; P. De Wolf; W. Vandervorst; L. Hellemans; A. Malavé; D. Büchel; E. Oesterschulze; W. Kulisch; P. Niedermann; T. Sulzbach; O. Ohlsson
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics (ISSN 0734-211X)
- Published
- 2000
- Field
- Engineering (Physical Sciences)